Transmission Electron Microscope
Metallurgical and Materials Engineering
Institute of Natural and Applied Sciences
Second Cycle (Master's Degree)
| Course Unit Title | Course Unit Code | Type of Course Unit | Level of Course Unit | Year of Study | Semester | ECTS Credits |
|---|---|---|---|---|---|---|
| Transmission Electron Microscope | MMT517 | Elective | Master's degree | 1 | Fall | 8 |
Name of Lecturer(s)
Associate Prof. Dr. Mustafa Burak TELLİ
Learning Outcomes of the Course Unit
1) Comprehend the working principles and types of transmission electron microscope (TEM)
2) Comprehend working principles of TEM’s parts, source of electron, condenser lenses, aberrations and corrections in lenses, camera systems, vacuum systems.
3) Explain contrast and imaging mechanism in TEM.
4) Perform adjusment of microscope and determination of using conditions, accelerator voltage, adjusment of aperture, photographing
5) Perform electron diffraction in TEM, bright and dark field imaging, sample rotation, energy dispersive and electron energy loss analysis
6) Explain high resolution and scanning transmission electron microscope
7) Apply sample preparation techniques in TEM
8) List the effect of radiation on the sample from TEM.
Program Competencies-Learning Outcomes Relation
| Program Competencies | ||||
| 1 | 2 | 3 | ||
| Learning Outcomes | ||||
| 1 | High | High | Middle | |
| 2 | High | High | Middle | |
| 3 | High | High | Middle | |
| 4 | High | High | Middle | |
| 5 | High | High | Middle | |
| 6 | High | High | Middle | |
| 7 | High | High | Middle | |
| 8 | High | High | Middle | |
Mode of Delivery
Face to Face
Prerequisites and Co-Requisites
None
Recommended Optional Programme Components
Not Required
Course Contents
This course equips candidates with in-depth knowledge on; working principles and types of transmission electron microscope (TEM) - working principles of TEM’s parts, source of electron, condenser lenses, aberrations and corrections in lenses, camera systems, vacuum systems - contrast and imaging mechanism in TEM – adjusment of microscope and determination of using conditions, accelerator voltage, adjusment of aperture, photographing – electron diffraction in TEM, bright and dark field imaging, sample rotation, energy dispersive and electron energy loss analysis – high resolution and scanning transmission electron microscope – sample preparation techniques in TEM - effects of radiation on the sample from TEM
Weekly Schedule
1) Introduction Transmission Electron Microscopy2) Elastic Electron Scattering in Transmission Electron Microscopy
3) Elastic Electron Scattering in Transmission Electron Microscopy
4) Inelastic Electron Scattering in Transmission Electron Microscopy
5) Inelastic Electron Scattering in Transmission Electron Microscopy
6) Electron Sources in Transmission Electron Microscopy
7) Lenses, Apaertures and their adjustments in Transmission Electron Microscopy
8) Midterm examination/Assessment
9) Screens and Cameras Used Transmiision Electron Microscopy
10) Sample Height, Condenser and Objectşve Lens Adjustments in TRansmission Electron Microscopy
11) Bright Field, Dark Field and Selected area Electron Diffraction in Transmission Electron Microscopy
12) Sample Preperation Techniques in Transmission Electron Mikroscopy
13) Electron Difraction in Transmission Electron Microscopy
14) Single and polycrystalline electron difraction patterns in Transmission Electron Microscopy
15) Scanning Transmission Electron Microscopy
16) Final examination
Recommended or Required Reading
Planned Learning Activities and Teaching Methods
1) Lecture
2) Discussion
3) Demonstration
4) Group Study
5) Problem Solving
Assessment Methods and Criteria
Contribution of Midterm Examination to Course Grade |
40% |
|---|---|
Contribution of Final Examination to Course Grade |
60% |
Total |
100% |
Language of Instruction
Turkish
Work Placement(s)
Not Required