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Course Unit Title | Course Unit Code | Type of Course Unit | Level of Course Unit | Year of Study | Semester | ECTS Credits |
---|---|---|---|---|---|---|
Advanced Material Characterization | MMT620 | Compulsory | Doctorate degree | 1 | Spring | 8 |
Associate Prof. Dr. Mustafa Burak TELLİ
1) Carrying out the procedures for taking, preparing, etching samples.
2) Describing the light microscope, development of contrast by light photons and contrasting techniques.
3) Conducting macro and micro-structure analysis.
4) Carrying out quantitative metallography.
5) Defining electron microscopy and imaging using electrons.
6) Defining SEM, imaging, contrast development, contrasting techniques and EDX.
7) Defining TEM, imaging, contrast development, contrasting techniques and STEM.
8) Defining PEEM, imaging, contrast development, contrasting techniques.
9) Defining FIM, imaging, contrast development, contrasting techniques and AP.
10) Defining x-rays, imaging and analytic.
11) Conducting x-ray fluorescence analysis.
12) Defining x-ray diffraction analysis, phase determination, lattice parameter determination, crystallite size determination, quantitative analysis.
13) Conducting thermal analysis, cooling curve, dilatometer, DTA applications.
Program Competencies | ||||
1 | 2 | 3 | ||
Learning Outcomes | ||||
1 | Low | High | Middle | |
2 | Low | High | Middle | |
3 | Low | High | Middle | |
4 | Low | High | Middle | |
5 | Low | High | Middle | |
6 | Low | High | Middle | |
7 | Low | High | Middle | |
8 | Low | High | Middle | |
9 | Low | High | Middle | |
10 | Low | High | Middle | |
11 | Low | High | Middle | |
12 | Low | High | Middle | |
13 | Low | High | Middle |
Face to Face
None
Materials Science, Materials Characterization
Introduction to metallography (methods for taking, preparing, etching samples), Optical microscope (development of contrast by light photons and contrasting techniques), Analysis of macro and micro-structure (steels, cast irons, non-ferrous metals and alloys), Quantitative metallography (image analysis), Electron microscopy (electrons and imaging), SEM (imaging, contrast development and contrasting techniques) and EDX, TEM (imaging, contrast development and contrasting techniques) and STEM, PEEM (imaging, contrast development and contrasting techniques), FIM (imaging, contrast development and contrasting techniques) and AP, Introduction to x-rays (imaging and analytical), X-ray fluorescence analysis, X-ray diffraction analysis (Determination of phases, Determination of lattice parameters, Determination of crystallite sizes, Quantitative analysis), Thermal analysis (Cooling curve, Dilatometer, DTA).
Contribution of Midterm Examination to Course Grade |
40% |
---|---|
Contribution of Final Examination to Course Grade |
60% |
Total |
100% |
Turkish
Not Required